Rapid In-Line Inspection Of Silicon Solar Wafers And Cells

Prof. Mohd Zaid Abdullah

To develop machine vison system for in- line inspection of crystaline silicon wafers and cells.
To investigate the luminescence technologies for defect detection.

TT-Vision Technologies has entered into agreements with USM:

Memorandum of Agreement (2019)
Objective: To prototype micro-crack inspection system based on optical transflection.
Total Funding: RM204,857 (TT-Vision Technologies).
Memorandum of Agreement on Industrial Master/PhD (2013)
Objective: To provide platform, support and technical expertise needed for Master/PhD students to do research on solar wafer/cell
Total Funding: RM335,200 (CREST).
Collaboration Agreement (2011)
Objective: To explore collaborative research on solar wafer/cell inspection.

To-date this collaboration has resulted in 1 IP, 3 PhD Scholars, 1 MSc Scholar, 11 scholarly articles and 12 conference proceedings.

Optical Transmission Inspection: Micro-crack, inclusion, and pinhole inspection on as-cut silicon wafers.
Electroluminescence: Micro-crack, broken fingers, inactive regions, and dark spot inspections on fully completed crystalline silicon solar cells and PV modules.
Photoluminescence: Contactless micro-crack, broken fingers, inactive regions, and dark spot inspections on in-process and fully completed silicon solar cells.
Transflection Imaging: Contactless high clarity micro-crack inspection on all production process stages of a crystalline silicon solar cell.